Jian Cheng Zhang,M. A. Styblinski: Yield and Variability Optimization of Integrated Circuits
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Author: Jian Cheng Zhang,M. A. Styblinski
Number of Pages: 234 pages
Published Date: 02 Nov 2012
Publisher: Springer-Verlag New York Inc.
Publication Country: New York, NY, United States
Language: English
ISBN: 9781461359357
Download Link: Click Here
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